Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water

• Jason I. Kilpatrick,
• Emrullah Kargin and
• Brian J. Rodriguez

Beilstein J. Nanotechnol. 2022, 13, 922–943, doi:10.3762/bjnano.13.82

• in environment, tip–sample distance, and the influence of piezo-based mechanical activation significantly complicates these relationships and, as such, many techniques require the explicit measurement of XGain in order to be quantitative [29]. Spectral KPFM techniques (e.g., band excitation KPFM (BE

• -KPFM) [40][64][72], half-harmonic band excitation (HHBE-KPFM) [28][82], and G-mode [14][48][49][50]) that can measure the amplitude response of the cantilever as a function of frequency and DC bias, can access XGain directly as part of the measurements. Lastly, KPFM-based techniques can also utilize

Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• operation on either an AM or FM modulation have been demonstrated [34][35][36]. They incorporate a direct measurement of either the amplitude or frequency response of the AFM probe to an applied single-frequency bias modulation. Furthermore, multi-frequency operations of OL KPFM were introduced as band

• -excitation OL BE-KPFM [37][38][39], intermodulation electrostatic force microscopy [40], and dual-harmonic KPFM (DH-KPFM) [34][41][42]. In DH-KPFM, the CPD is obtained from the ratio of the amplitudes of the first two harmonics of the cantilever response to an AC bias modulation and requires a prior

The role of convolutional neural networks in scanning probe microscopy: a review

• Ido Azuri,
• Irit Rosenhek-Goldian,
• Neta Regev-Rudzki,
• Georg Fantner and
• Sidney R. Cohen

Beilstein J. Nanotechnol. 2021, 12, 878–901, doi:10.3762/bjnano.12.66

• conditions for band-excitation piezoresponse force microscopy (PFM) [134]. Band excitation collects a band of frequencies around the contact resonance frequency of the tip–sample system, which is modeled by a simple harmonic oscillator equation. This allows for the determination of several physical

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• ]. In addition, density functional theory has been used to model the effect of ion-induced defects on the electronic band structure of various 2D transition metal dichalcogenides [26][30][36], and band-excitation Kelvin probe microscopy has been used to probe the resulting changes in the local work

On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2020, 11, 1409–1418, doi:10.3762/bjnano.11.125

• ]) and band-excitation AFM [9][29], as well as dynamic methods based on multifrequency AFM [4][5] and multi-harmonic AFM [30][31] have also been implemented to measure an effective modulus of elasticity and an effective coefficient of dissipation (or analogous quantities) across the surface. All of these

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

• Edgar Cruz Valeriano,
• José Juan Gervacio Arciniega,
• Christian Iván Enriquez Flores,
• Susana Meraz Dávila,
• Joel Moreno Palmerin,
• Martín Adelaido Hernández Landaverde,
• Yuri Lizbeth Chipatecua Godoy,
• Aime Margarita Gutiérrez Peralta,
• Rafael Ramírez Bon and
• José Martín Yañez Limón

Beilstein J. Nanotechnol. 2020, 11, 703–716, doi:10.3762/bjnano.11.58

• acoustic microscopy (AFAM) [1], bimodal AFM [15], resonance tracking-atomic force acoustic microscopy (RT-AFAM) [7], band excitation [10], dual-frequency resonance-tracking atomic force microscopy [16], nanomechanical spectroscopy [2], G-mode [17] and triple frequency atomic force microscopy [18]. Even

Comparison of fresh and aged lithium iron phosphate cathodes using a tailored electrochemical strain microscopy technique

• Matthias Simolka,
• Hanno Kaess and
• Kaspar Andreas Friedrich

Beilstein J. Nanotechnol. 2020, 11, 583–596, doi:10.3762/bjnano.11.46

• tracking (DRFT or DART) or band excitation (BE)), but uses a single tracking frequency, as it was already performed by Luchkin et al. [30]. Using a single tracking frequency far off the resonance frequency range of the tip–sample system limits the measurable signal intensity, but avoids any measurement

Correlative electrochemical strain and scanning electron microscopy for local characterization of the solid state electrolyte Li_1.3Al_0.3Ti_1.7(PO₄)₃

• Nino Schön,
• Deniz Cihan Gunduz,
• Shicheng Yu,
• Hermann Tempel,
• Roland Schierholz and
• Florian Hausen

Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148

• measurements on a commercially available Li-ion conducting glass ceramic (LICGC) using dual AC resonance tracking (DART) and band excitation (BE) as excitation methods. Furthermore, the authors calculated the diffusion constant and diffusion time of the commercially available LICGC, taking into account the

Synthesis of coaxial nanotubes of polyaniline and poly(hydroxyethyl methacrylate) by oxidative/initiated chemical vapor deposition

• Alper Balkan,
• Efe Armagan and
• Gozde Ozaydin Ince

Beilstein J. Nanotechnol. 2017, 8, 872–882, doi:10.3762/bjnano.8.89

• annealed (80 °C) and as-deposited PANI samples were found using the UV–vis spectra (Figure 2b). The band gap of PANI can be calculated from the wavelength of the polaron band excitation [45]. The onset of absorption of the polaron band excitation was used to find the band gap energies, Eg, of both samples

Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy

• Enrique A. López-Guerra and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 2149–2163, doi:10.3762/bjnano.5.224

• physically accurate models for viscoelastic samples. On the other hand, better quantitative agreement has been accomplished through contact-mode based techniques such as contact resonance AFM (CR-AFM) [17], band excitation AFM (BE-AFM) [18][19] and dual-amplitude resonance tracking AFM (DART-AFM) [20]. These

Probing viscoelastic surfaces with bimodal tapping-mode atomic force microscopy: Underlying physics and observables for a standard linear solid model

• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 1649–1663, doi:10.3762/bjnano.5.176

• excitation for a single eigenmode [21][22], band excitation single- or dual-mode characterization [23][24] and techniques based on the observation of higher harmonics and their inversion to obtain force distance curves [25][26]. Most of the discussion in this paper is based on the AM-OL method of Rodriguez

• storage and loss moduli. These moduli are classical bulk quantities, but AFM measurements can exhibit relatively good correlation with results obtained from bulk measurements [6][7]. Analogous measurements can be performed by using the band excitation method [23][29], within which the cantilever is driven

Enhancement of photocatalytic H₂ evolution of eosin Y-sensitized reduced graphene oxide through a simple photoreaction

• Weiying Zhang,
• Yuexiang Li,
• Shaoqin Peng and
• Xiang Cai

Beilstein J. Nanotechnol. 2014, 5, 801–811, doi:10.3762/bjnano.5.92

• absorption wavelength of EY in TMA solution (inset of Figure 8). Mechanism When GO is irradiated by UV light, holes h+ (in HOMO) and electrons e− (in LUMO) are produced in its π-conjugated domains due to π–π* band excitation [35]. These holes (h+) and electrons (e−) react with the oxygen-containing groups of

Correction to "Energy dissipation in multifrequency atomic force microscopy"

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 667–667, doi:10.3762/bjnano.5.78

• /bjnano.5.78 Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference; wavelet transforms; In the section "Energy dissipation" of the above manuscript, there is a typesetting error in the mathematical expressions after Equation 5. The correct form must be: The energy

Energy dissipation in multifrequency atomic force microscopy

• Valentina Pukhova,
• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2014, 5, 494–500, doi:10.3762/bjnano.5.57

• evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force microscopy, in a regime where few cantilever oscillation cycles characterize the tip–sample interaction. Keywords: band excitation; multifrequency atomic force microscopy (AFM); phase reference

Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

• Gheorghe Stan and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 278–288, doi:10.3762/bjnano.5.30

• band excitation (BE) method, a time-dependent signal containing a band of frequencies around the desired resonance is applied at each pixel of the scan, such that the frequency response at that location can be rapidly obtained through a Fourier transform of the cantilever tip response and a fit to a

Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM

• Igor Beinik,
• Markus Kratzer,
• Astrid Wachauer,
• Lin Wang,
• Yuri P. Piryatinski,
• Gerhard Brauer,
• Xin Yi Chen,
• Yuk Fan Hsu,
• Aleksandra B. Djurišić and
• Christian Teichert

Beilstein J. Nanotechnol. 2013, 4, 208–217, doi:10.3762/bjnano.4.21

• photoconductivity involving electron–hole pair generation by light induced band-to-band excitation and subsequent oxygen desorption as a surface process [22]. We suggest instead that the observed peculiarities of photoconductivity under ambient conditions can be attributed to the presence of defect states in the

Wavelet cross-correlation and phase analysis of a free cantilever subjected to band excitation

• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2012, 3, 294–300, doi:10.3762/bjnano.3.33

• ” information on the driver-response phase delay as a function of frequency. These concepts are introduced through the calculation of the response of a free cantilever subjected to continuous and impulsive excitation over a frequency band. Keywords: AFM; band excitation; force; wavelet transforms

• well beyond simple topographic measurements [1][2]. Among the techniques developed in dynamic AFM, multimode excitation and the so called band-excitation methods have been put forward recently [3][4][5]. All of these techniques are based on the frequency, amplitude and phase response around one or more

• : The continuous and the impulsive band excitation of a free cantilever. Before introducing the cross-correlation concept, we give a brief introduction to wavelet transform theory [19]. Wavelet analysis is based on the projection (convolution) of a discrete time series f(t) (the signal), where t is the

Femtosecond time-resolved photodissociation dynamics of methyl halide molecules on ultrathin gold films

• Mihai E. Vaida,
• Robert Tchitnga and
• Thorsten M. Bernhardt

Beilstein J. Nanotechnol. 2011, 2, 618–627, doi:10.3762/bjnano.2.65

• excitation was found to lead to the decomposition of the molecules on the gold surface. This was interpreted as an indication for a considerable red-shift of the A-band excitation of methyl bromide due to the interaction with the substrate. The alternative mechanism of dissociative electron attachment was

• short distances (Figure 2) it is likely that this would require a three-photon transition, which is not in accordance with our observed two-photon ionization probe process. Therefore, it is assumed instead that one single photon of 266 nm excited the adsorbed methyl iodide molecule to the A-band

• (excitation mechanism (2) in Figure 2). The peak structure is then attributed to the dynamics of the dissociating excited transition state of methyl iodide in the A-band, which can be directly ionized with the highest cross section after 50 fs by two photons of the probe pulse at 333 nm wavelength (excitation